measurement – MSP Data Systems Inc.

Chip Shot: Intel and NIST Get Critical (Dimensions) with X-rays

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October 20, 2015
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chip-design, limits, measurement, metrology, new-measurement, research, silicon, silicon-chip, single-silicon, technology

With features of silicon chips shrinking to single-digit nanometers, measurement tools long used to monitor chip production are approaching their limits. Factor in the growing complexity of chip design, and it’s easy to understand why Intel is working with the National Institute of Standards & Technology (NIST) on new measurement capabilities.